IEC QUALITY ASSESSMENT SYSTEM (IECQ) covering Electronic Components, Assemblies, Related Materials and Processes
For rules and details of the IECQ visit www.iecq.org
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IECQ Certificate of Approval
Independent Testing Laboratory
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IECQ Certificate No.:
| IECQ-L NSAIUS 09.0005
| Issue No.:
| 4
| Status:
| Superseded
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Supersedes:
| IECQ-L NSAIUS 09.0005 Issue 3
| Issue Date:
| 2012/10/16
| Org. Issue:
| 2008/10/21
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CB Reference No.:
| 1.72.0031/B
| Expiration:
| 2014/12/18
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Integrated Service Technology (Kunshan) Co., Ltd.
1F, Zong He Building, No. 1618, Yi-Shan Rd.,
Shanghai City
China
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The organization, facilities and procedures have been assessed and found to comply with the applicable requirements for Independent Testing Laboratory organization approval, in support of the IECQ system, which is in accordance with the Basic Rules IECQ 01 and Rules of Procedure IECQ 03-6 "Independent Testing Laboratory Assessment Program Requirements" of the IEC Quality Assessment System for Electronic Components (IECQ) and applicable requirements of ISO/IEC 17025:2005 for the testing of electronic components under the IECQ.
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Scope:
Environmental and reliability testing, inspection and failure analysis (by standards of IEC 60068, MIL-STD-202, MIL-STD-810, MIL-STD-883, JESD-22 series, ANSI/ESD STM5.1/5.2/5.3, BELL Core GR-63, J-STD-020, AEC-Q100, AEC-Q101, IPC-TM-650, IPC-A-600, IPC-A-610, IPC-6012, J-STD-035, JESD201, EIAJ ED-4701), Including tests of: Electrostatic discharge test (HBM/MM/CDM), External visual, Emission microscope, Focused Ion Beam, Highly Accelerated Temperature and Humidity Stress test, High Temperature Storage Life, Humidity storage, Latch-up, Low Temperature Storage Life, Micro section, Moisture Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices, Preconditioning of Nonhermetic Surface Mount Device Prior To Reliability, Probe station, Accelerated Moisture Resistance Unbiased Autoclave(Pressure cook), Scanning electron microscope, Temperature and Humidity Bias Life, Temperature Bias and Operating Life, Temperature cycling, Thermal shock, Cycled Temperature Humidity Bias Life, Accelerated Moisture Resistance -Unbiased HAST.
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Issued by the Certification Body: National Standards Authority of Ireland, Inc. |
402 Amherst Street, Suite 304 NASHUA, NH 03063
United States
Authorised Person:
Kevin D Mullaney
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The validity of this certificate is maintained through on-going surveillance audits by the IECQ CB issuing this certificate. This Certificate of Conformity may be suspended or withdrawn in accordance with the
Rules of Procedure of the IECQ System and its Schemes.
This certificate and any schedule(s) may only be reproduced in full.
This certificate is not transferable and remains the property of the issuing IECQ CB.
The Status and authenticity of this certificate may be verified by visiting www.iecq.org.
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IECQ-L Rev. 10
- Attached Translation: none [ Add ]
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